EBSD analysis of the microtexture of Ba-hexaferrite samples

The microtexture of differently prepared Ba-hexaferrite samples is investigated by means of electron backscatter diffraction (EBSD). Kikuchi patterns are obtained with a high image quality, enabling a spatial resolution of the EBSD maps of about 20 nm. The spatially highly resolved EBSD mappings provide additional information (individual grain orientation, misorientation angles, grain size distribution) as compared to the standard analysis techniques, which can contribute to an optimization of the growth process. Furthermore, as the crystallographic orientation of each grain is known, an exact analysis of the grain aspect ratio becomes possible which provides further insight to the microstructural dependence of the magnetic properties of ferrites.